Environmental Cantrol-type Atomic force microscope

1.Integrated   design  of  optical   metallographic   microscope  and  atomic  force   microscope,with powerful   functions.

2. Having  both  optical  microscope  and  atomic  force  microscope  imaging  functions,both  can work simultaneously without affecting each other.

3. Can    work    simultaneously    in   ordinary   air,liquid,temperature   controlled,and    inert   gas controlled   environments.

4.The  laser detection adopts a vertical optical path design,which can work in liquid with a gas- liquid dual purpose probe frame.

5.Single  axis drive sample automatically approaches the probe vertically,making the needle tip perpendicular to the sample scanning.

6.Intelligent   needle   feeding   method   for   motor   controlled   piezoelectric   ceramic   automatic detection,protecting  probes  and  samples.

7. Ultra   high   magnification  optical  positioning  system  for  precise  positioning  of  probe  and sample  scanning  areas.

8. Integrated    scanner    non-linear    correction    user    editor,with    nano    characterization   and measurement accuracy  better than 98%.

9. The  sample  scanning  table  and  laser  detection  head  are  designed  with  a  closed  design, which  can  be  filled  with  special  gases   internally  without  the   need  for  additional  sealing Covers.